EDN

Design for test boot camp, part 2: Test compression

The size of designs continues to grow and IC manufacturers are pushing for higher test quality, especially in mission-critical applications such as transportation and medicine. More advanced nodes ...
EDN

Test Compression

Scan technology is essential for testing the digital content of large-volume devices. By using scan, you can make the device itself responsible for some of the “test” chores, and you can shorten the ...
Semiconductor Engineering

Squeezing Out More Test Compression

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...
Design-Reuse

Synopsys Unveils New Synthesis-Based Test Technology Delivering Up to 3X Higher Compression

MOUNTAIN VIEW, Calif., June 11, 2013-- Synopsys, Inc. (Nasdaq: SNPS), a global leader providing software, IP and services used to accelerate innovation in chips and electronic systems, today unveiled ...
Electronic Design

Low-pin-count test helps manage test cost

The ability to control test cost while design sizes have grown exponentially is a success story that relies on the invention and continuous improvement of embedded test compression. One way test ...
For Construction Pros

Compression Testing Machine

High quality and versatile Compression Testing Machine with certification of a UKAS accredited calibration. The Compression Testing machine CRT-CTM250-II was developed to perform a variety of ...