Detection of defects on patterned semiconductor wafers is a critical step in wafer production. Many inspection methods and apparatus have been developed for this purpose. We recently presented an ...

Following the closure of multiple attractions, Walt Disney World has updated the map of the Magic Kingdom. The new Magic ...

This paper describes the thermal characterization and power map methodology on chipset silicon die. The on-die power map affects the overall thermal gradient and heat spreading effect from the die to ...