The size of designs continues to grow and IC manufacturers are pushing for higher test quality, especially in mission-critical applications such as transportation and medicine. More advanced nodes ...

Scan technology is essential for testing the digital content of large-volume devices. By using scan, you can make the device itself responsible for some of the “test” chores, and you can shorten the ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

MOUNTAIN VIEW, Calif., June 11, 2013-- Synopsys, Inc. (Nasdaq: SNPS), a global leader providing software, IP and services used to accelerate innovation in chips and electronic systems, today unveiled ...

The ability to control test cost while design sizes have grown exponentially is a success story that relies on the invention and continuous improvement of embedded test compression. One way test ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...