Cryogenic microscopy at Diamond Light Source enables high-resolution, correlative imaging of cells under near-physiological ...
Transmission electron microscopes (TEMs) allow researchers at the forefront of energy technology to study next-generation battery materials down to ...
Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage ...
A research team led by Professor Lu Jian, Dean of the College of Engineering and Chair Professor in the Department of ...
Tech Xplore on MSN
'Milestone' findings on imaging methods call for a closer look at battery microscopy
Transmission electron microscopes (TEMs) allow researchers at the forefront of energy technology to study next-generation ...
Tech Xplore on MSN
Electron microscopy shows 'mouse bite' defects in semiconductors
Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...
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