The final session will be a presentation on examples of RF exposure problems, including measurement equipment and techniques that take into account operator-induced uncertainty, presented by Doczkat ...

Semiconductor test engineers can expect to increasingly confront problems related to RF, memory, and compression-based-scan test; timing and jitter measurements; design for manufacturability (DFM); ...

The RFS is imperative to our national security, and we can’t let oil companies dictate the safety of our men and women in uniform.