For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...
When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...
Scan diagnostics play an important role in improving yield. As technologies move below 130 nm, the IC industry has seen a significant change in the type of defects encountered. Feature-related defects ...
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