The semiconductor industry continues to face numerous challenges as designs approach reticle limits, process nodes evolve and engineering resources become increasingly stretched. It is essential to ...

Of all the electronic design automation (EDA) tools on the market, design for test (DFT) may be the most under-appreciated; even though building testability into a chip during the design phase will ...

In the modern era, where meeting high performance and low power targets for any complex SoC (System on Chip) is very tough, testing the SoC has become even more challenging. The purpose of several DFT ...

The use of hierarchical DFT methods is growing as design size and complexity stresses memory requirements and design schedules. Hierarchical DFT divides the design into smaller pieces, creates test ...

Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these techniques ...

Shipping high-quality ICs requires that design-for-test (DFT) methodologies be included in a design. DFT provides external access at the device’s I/O pins to internal registers to either control or ...